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JEONG, YOON HA(정윤하)
Department
Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
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Date issued
2011
1
Type
Article
1
Subject
HfSiON
1
high-k dielectric
1
interfacial layer (IL)
1
positive bias temperature instabi...
1
reliability
1
SiON
1
stress-induced leakage current (S...
1
time-dependent dielectric breakdo...
1
Journal Registered
SCIE
1
SCOPUS
1
Applied search limites :
Date Issued
: [2010 TO 2016]
Type
: Article
Date Issued
: 2011
Subject
: reliability
Subject
: positive bias temperature instability (BTI) (PBTI)
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Article
Interfacial-layer-driven dielectric degradation and breakdown of HfSiON/SiON gate dielectric nMOSFETs
SCIE
SCOPUS
IEEE ELECTRON DEVICE LETTERS, vol. 32, no. 10, page. 1319 - 1321, 2011-10
Choi, DY
;
Lee, KT
;
Baek, CK
;
Sohn, CW
;
Sagong, HC
;
et al
1
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