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JEONG, YOON HA(정윤하)
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Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
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Date issued
2008
1
Type
Article
1
Subject
capacitance extraction
1
capacitance-voltage (C - V)
1
deembedding
1
DIELECTRICS
1
gate leakage
1
MOS
1
OXIDE
1
RF
1
series resistance
1
ultrathin oxide
1
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SCIE
1
SCOPUS
1
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Date Issued
: 2008
Subject
: capacitance-voltage (C - V)
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Article
RF capacitance extraction utilizing a series resistance deembedding scheme for ultraleaky MOS devices
SCIE
SCOPUS
IEEE ELECTRON DEVICE LETTERS, vol. 29, no. 3, page. 238 - 241, 2008-03
Choi, GB
;
Hong, SH
;
Jung, SW
;
Kang, HS
;
Jeong, YH
1
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