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JEONG, YOON HA(정윤하)
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Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
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Date issued
2010
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Article
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INVERSION-LAYERS
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PERFORMANCE
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SCIE
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SCOPUS
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Applied search limites :
Date Issued
: [2010 TO 2015]
Date Issued
: 2010
Subject
: CHANNEL
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Conference Papers(Domestic)
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Article
Comparison of Series Resistance and Mobility Degradation Extracted from n- and p-Type Si-Nanowire Field Effect Transistors Using the Y-Function Technique
SCIE
SCOPUS
JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 49, no. 4, page. 4DN06-01 - 4DN06-05, 2010-04
Baek, RH
;
BAEK, CHANG KI
;
Jung, SW
;
Yeoh, YY
;
Kim, DW
;
et al
1
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