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JEONG, YOON HA(정윤하)
Department
Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.0 seconds).
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Date issued
2010
1
Type
Article
1
Subject
Degradation
1
DESIGN
1
electrostatic discharge (ESD)
1
failure analysis
1
GATE
1
gate oxide breakdown
1
nanowire field-effect transistor ...
1
PERFORMANCE
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PROTECTION
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SCIE
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: failure analysis
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: failure analysis
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: PERFORMANCE
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: DESIGN
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: gate oxide breakdown
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Article
Failure Analysis of Si Nanowire Field-Effect Transistors Subject to Electrostatic Discharge Stresses
SCIE
SCOPUS
IEEE ELECTRON DEVICE LETTERS, vol. 31, no. 9, page. 915 - 917, 2010-09
Liu, W
;
Liou, JJ
;
Jiang, Y
;
Singh, N
;
Lo, GQ
;
et al
1
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