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JEONG, YOON HA(정윤하)
Department
Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
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Date issued
2013
1
Type
Article
1
Subject
DIELECTRICS
1
GATE
1
IMPACT
1
LAYER
1
PERFORMANCE
1
PMOSFETS
1
RELIABILITY
1
THICKNESS
1
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SCIE
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SCOPUS
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: PERFORMANCE
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: IMPACT
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: GATE
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: THICKNESS
Type
: Article
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Article
Improved Degradation and Recovery Characteristics of SiGe p-Channel Metal-Oxide-Semiconductor Field-Effect Transistors under Negative-Bias Temperature Stress
SCIE
SCOPUS
Japanese Journal of Applied Physics, vol. 52, no. 4, page. 4CC21-1 - 4CC21-4, 2013-04
Choi, DY
;
Sohn, CW
;
Sagong, HC
;
Jung, EY
;
Kang, CY
;
et al
1
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