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KOO, YANG MO(구양모)
Department
Ferrous & Energy Materials Technology(철강 · 에너지소재대학원)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.0 seconds).
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Date issued
2003
1
Type
Article
1
Subject
depth profile
1
NI
1
Si wafer
1
SURFACES
1
synchrotron radiation-total refle...
1
Journal Registered
SCIE
1
SCOPUS
1
Applied search limites :
Date Issued
: [2000 TO 2009]
Subject
: SURFACES
Date Issued
: 2003
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Article
Analysis of depth profile for impurity concentration in Si wafer by synchrotron radiation excited total reflection X-ray fluorescence spectroscopy
SCIE
SCOPUS
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, vol. 58, no. 8, page. 1445 - 1452, 2003-08-15
Huh, BK
;
Kim, JS
;
Shin, NS
;
Koo, YM
;
Chung, HY
1
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