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Browsing by AuthorChoi, R

전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

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Showing results 1 to 3 of 3

Article

Comparison of La-based high-k dielectrics: HfLaSiON and HfLaONSCIESCOPUS

MICROELECTRONIC ENGINEERING, vol. 86, no. 3, page. 268 - 271, 2009-03

Article

Effects of in situ O-2 plasma treatment on OFF-state leakage and reliability in metal-gate/high-k dielectric MOSFETsSCIESCOPUS

IEEE ELECTRON DEVICE LETTERS, vol. 29, no. 6, page. 565 - 567, 2008-06

Article

PBTI-associated high-temperature hot carrier degradation of nMOSFETs with metal-gate/high-k dielectricsSCIESCOPUS

IEEE ELECTRON DEVICE LETTERS, vol. 29, no. 4, page. 389 - 391, 2008-04

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