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IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. 43, no. 4, page. 519 - 526, 1996-04

IEEE ELECTRON DEVICE LETTERS, vol. 19, no. 7, page. 250 - 252, 1998-07

SOLID-STATE ELECTRONICS, vol. 42, no. 11, page. 2063 - 2068, 1998-11

MICROELECTRONICS RELIABILITY, vol. 38, no. 1, page. 171 - 178, 1998-01

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, vol. 20, no. 1, page. 274 - 277, 2002-01

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, vol. 21, no. 5, page. 2133 - 2137, 2003-09

APPLIED PHYSICS LETTERS, vol. 71, no. 18, page. 2656 - 2658, 1997-11-03

JOURNAL OF THE KOREAN PHYSICAL SOCIETY, vol. 30, page. S117 - S122, 1997-06

JOURNAL OF APPLIED PHYSICS, vol. 82, no. 10, page. 5011 - 5016, 1997-11-15