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Cited 12 time in webofscience Cited 12 time in scopus
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dc.contributor.authorSrinivasa Rao, G.-
dc.contributor.authorRaza, M.A.-
dc.contributor.authorAslam, M.-
dc.contributor.authorAl-Marshadi, A.H.-
dc.contributor.authorJun, C.-H.-
dc.date.accessioned2020-02-26T08:50:16Z-
dc.date.available2020-02-26T08:50:16Z-
dc.date.created2019-04-30-
dc.date.issued2019-03-
dc.identifier.issn2169-3536-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/101152-
dc.description.abstractThis paper proposed a process capability index-based control chart under the new extended form of multiple-dependent state sampling (MDS) named generalized MDS (GMDS). The scheme is based on inner and outer control limits and utilizes the previous state of the samples. The performance comparisons of the proposed chart with the existing charts are made by using out-of-control ARL. The simulation study showed the superiority of the proposed chart over the existing PCI-based control charts under Shewhart and MDS schemes. An empirical illustration is also given to demonstrate the application of the proposed chart.-
dc.languageEnglish-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.relation.isPartOfIEEE Access-
dc.titleA Variable Control Chart Based on Process Capability Index Under Generalized Multiple Dependent State Sampling-
dc.typeArticle-
dc.identifier.doi10.1109/ACCESS.2019.2903892-
dc.type.rimsART-
dc.identifier.bibliographicCitationIEEE Access, v.7, pp.34031 - 34044-
dc.identifier.wosid000463420600001-
dc.citation.endPage34044-
dc.citation.startPage34031-
dc.citation.titleIEEE Access-
dc.citation.volume7-
dc.contributor.affiliatedAuthorJun, C.-H.-
dc.identifier.scopusid2-s2.0-85063878869-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.isOpenAccessY-
dc.type.docTypeArticle-
dc.subject.keywordPlusControl charts-
dc.subject.keywordPlusFlowcharting-
dc.subject.keywordPlusQuality control-
dc.subject.keywordPluscapability indice-
dc.subject.keywordPlusControl limits-
dc.subject.keywordPlusPerformance comparison-
dc.subject.keywordPlusProcess capability indices-
dc.subject.keywordPlusSampling plans-
dc.subject.keywordPlussimulation-
dc.subject.keywordPlusSimulation studies-
dc.subject.keywordPlusVariable control-
dc.subject.keywordPlusProcess control-
dc.subject.keywordAuthorcapability indice-
dc.subject.keywordAuthorControl charts-
dc.subject.keywordAuthorquality control-
dc.subject.keywordAuthorsampling plans-
dc.subject.keywordAuthorsimulation-
dc.relation.journalWebOfScienceCategoryComputer Science, Information Systems-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryTelecommunications-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaTelecommunications-

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