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Deep-Learning Based Autofocus Score Prediction of Scanning Electron Microscope
- Title
- Deep-Learning Based Autofocus Score Prediction of Scanning Electron Microscope
- Authors
- Kim, Huisoo; Oh, Moohyun; Lee, Heerang; Jang, Jonggyu; Kim, Myeung Un; Yang, Hyun Jong; Ryoo, Michael; Lee, Junhee
- Date Issued
- 2019-08
- Publisher
- Cambridge University Press (CUP)
- Article Type
- Conference
- Citation
- Microscopy and Microanalysis, page. 182 - 183, 2019-08
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Related Researcher
- 양현종YANG, HYUN JONG
- Dept of Electrical Enginrg