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Drastic reliability improvement using H2O2/UV treatment of HfO2 for heterogeneous integration

Title
Drastic reliability improvement using H2O2/UV treatment of HfO2 for heterogeneous integration
Authors
LEE, BYOUNG HUN
Date Issued
2021-03-23
Publisher
IEEE
URI
https://oasis.postech.ac.kr/handle/2014.oak/116509
Article Type
Conference
Citation
IRPS 2021, 2021-03-23
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