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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | BAEK, ROCK HYUN | - |
| dc.contributor.author | 정진수 | - |
| dc.contributor.author | 이상욱 | - |
| dc.contributor.author | 이승환 | - |
| dc.contributor.author | 이준종 | - |
| dc.contributor.author | 임재완 | - |
| dc.date.accessioned | 2024-01-23T00:26:29Z | - |
| dc.date.available | 2024-01-23T00:26:29Z | - |
| dc.date.created | 2023-12-19 | - |
| dc.date.issued | 2023-09-08 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/119824 | - |
| dc.language | English | - |
| dc.publisher | 2023 SSDM | - |
| dc.relation.isPartOf | 2023 International Conference on Solid State Devices and Materials (SSDM) | - |
| dc.title | Holistic Analysis of Asymmetry in Vertical Silicon Gate-all-around Nanosheet FETs | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | 2023 International Conference on Solid State Devices and Materials (SSDM) | - |
| dc.citation.conferenceDate | 2023-09-05 | - |
| dc.citation.conferencePlace | JA | - |
| dc.citation.title | 2023 International Conference on Solid State Devices and Materials (SSDM) | - |
| dc.contributor.affiliatedAuthor | BAEK, ROCK HYUN | - |
| dc.contributor.affiliatedAuthor | 정진수 | - |
| dc.contributor.affiliatedAuthor | 이상욱 | - |
| dc.contributor.affiliatedAuthor | 이승환 | - |
| dc.contributor.affiliatedAuthor | 이준종 | - |
| dc.contributor.affiliatedAuthor | 임재완 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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- 백록현BAEK, ROCK HYUN
- Dept of Electrical Enginrg