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BCl3/Cl2 plasma etching process of ferroelectric gate stack for device integration

Title
BCl3/Cl2 plasma etching process of ferroelectric gate stack for device integration
Authors
BAEK, ROCK HYUN강보현안성민박종서안제현유현서
Date Issued
2023-02-15
Publisher
KCS
URI
https://oasis.postech.ac.kr/handle/2014.oak/119855
Article Type
Conference
Citation
제 30회 한국반도체학술대회, 2023-02-15
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백록현BAEK, ROCK HYUN
Dept of Electrical Enginrg
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