Direct measurement of the magnetic penetration depth by magnetic force microscopy
SCIE
SCOPUS
- Title
- Direct measurement of the magnetic penetration depth by magnetic force microscopy
- Authors
- Kim, Jeehoon; Civale, L; Nazaretski, E; Haberkorn, N; Ronning, F; Sefat, A S; Tajima, T; Moeckly, B H; Thompson, J D; Movshovich, R
- Date Issued
- 2012-11
- Publisher
- Institute of Physics Publishing
- Abstract
- We present an experimental approach using magnetic force microscopy for measurements of the absolute value of the magnetic penetration depth lambda in superconductors. lambda is obtained in a simple and robust way without introducing any tip modeling procedure via direct comparison of the Meissner response curves for a material of interest to those measured for a reference sample. Using a well-characterized Nb film as a reference, we determine the absolute value of lambda in a Ba(Fe0.92Co0.08)(2)As-2 single crystal and a MgB2 thin film through a comparative experiment. Our apparatus features simultaneous loading of multiple samples, and allows straightforward measurement of the absolute value of lambda in superconducting thin film or single-crystal samples.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/123920
- DOI
- 10.1088/0953-2048/25/11/112001
- ISSN
- 0953-2048
- Article Type
- Article
- Citation
- Superconductor Science and Technology, vol. 25, no. 11, page. 112001, 2012-11
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