Contact-free reactions between micropipes in bulk SiC growth
SCIE
SCOPUS
- Title
- Contact-free reactions between micropipes in bulk SiC growth
- Authors
- Mikhail Yu. Gutkin; Sheinerman, AG; Kohn, VG; Argunova, TS; Smirnov, MA; Je, JH
- Date Issued
- 2012-08
- Publisher
- WILEY-VCH
- Abstract
- It has been generally accepted that any reaction between micropipes in silicon carbide (SiC) crystals requires a direct contact of the micropipes. We propose a new model of contact-free reactions that are realized through the emission and absorption of full-core dislocations by micropipes. This model can explain the correlated reduction in micropipe radii in the samples with low micropipe densities which has been observed in synchrotron radiation (SR) phase contrast images supported by computer simulations. We provide a theoretical description of a contact-free reaction between two parallel micropipes.
- Keywords
- crystal structure; defects; single crystal growth; synchrotron X-ray diffraction; SILICON-CARBIDE; SINGLE-CRYSTALS; SCREW DISLOCATIONS; EPITAXIAL LAYERS; TRANSFORMATION; REDUCTION; EVOLUTION; DEFECTS
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/16295
- DOI
- 10.1002/PSSA.201127682
- ISSN
- 1862-6300
- Article Type
- Article
- Citation
- PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, vol. 209, no. 8, page. 1432 - 1437, 2012-08
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