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Ballistic-mode plasma-based ion implantation for surface-resistivity modification of polyimide film SCIE SCOPUS

Title
Ballistic-mode plasma-based ion implantation for surface-resistivity modification of polyimide film
Authors
Park, BKim, JCho, MNamkung, WKim, SJYoo, HY
Date Issued
2012-06
Publisher
IEEE
Abstract
5 Plasma-based ion implantation (PBII) is the well-established technique for material surface modification. In this paper, we described the ballistic-mode PBII process in which repetitive high-voltage pulses are applied to the grid a few centimeters from a polyimide (PI) film target. The high-voltage pulse applied to the grid has the peak values of -30 kV, width of 2.5 mu s, rise time of 1.5 mu s, and fall time of 0.5 or 40 mu s. In this process, ions propagate ballistically from a grid to the PI film and modify the surface resistivity of the PI film. The efficiency of surface-resistivity modification depends on the fall time of the pulse applied to the grid. The ballistic-mode PBII process affects the surface characteristics of PI to a depth of similar to 90 nm.
Keywords
Insulator surface modification; ion implantation; pulse modulator; surface resistivity; DISSIPATION; TECHNOLOGY
URI
https://oasis.postech.ac.kr/handle/2014.oak/16442
DOI
10.1109/TPS.2012.219
ISSN
0093-3813
Article Type
Article
Citation
IEEE TRANSACTIONS ON PLASMA SCIENCE, vol. 40, no. 6, page. 1749 - 1752, 2012-06
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조무현CHO, MOO HYUN
Div. of Advanced Nuclear Enginrg
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