DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kang, TD | - |
dc.contributor.author | Lee, H | - |
dc.contributor.author | Park, WI | - |
dc.contributor.author | Yi, GC | - |
dc.date.accessioned | 2016-03-31T12:38:29Z | - |
dc.date.available | 2016-03-31T12:38:29Z | - |
dc.date.created | 2009-02-28 | - |
dc.date.issued | 2004-01 | - |
dc.identifier.issn | 0374-4884 | - |
dc.identifier.other | 2004-OAK-0000003965 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/18136 | - |
dc.description.abstract | We grew ZnO and Zn1-xMgxO thin films on (0001) sapphire substrates by using metal-organic vapor phase epitaxy and measured the pseudo-dielectric functions using variable-angle spectroscopic ellipsometry. We analyzed the pseudo-dielectric functions by using the multi-layer model. The dielectric functions were fitted by using a Holden model dielectric function. We used anisotropic layer modeling for the ZnO thin film, whereas we adopted the approximation of isotropic layer modeling for the Zn1-xMgxO alloys. We also discuss the Mg composition dependence of the bandgap and the binding energy in Zn1-xMgxO alloys, and consider the valence-band ordering in ZnO thin films. | - |
dc.description.statementofresponsibility | X | - |
dc.language | English | - |
dc.publisher | KOREAN PHYSICAL SOC | - |
dc.relation.isPartOf | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.subject | ZnO | - |
dc.subject | dielectric function | - |
dc.subject | ellipsometry | - |
dc.subject | critical point | - |
dc.subject | Holden model | - |
dc.subject | PHOTOREFLECTANCE SPECTRA | - |
dc.subject | OPTICAL-CONSTANTS | - |
dc.subject | ZINC-OXIDE | - |
dc.subject | CRYSTALS | - |
dc.subject | LAYER | - |
dc.title | Spectroscopic ellipsometric study of ZnO and Zn1-xMgxO thin films grown on (0001) sapphire substrate | - |
dc.type | Article | - |
dc.contributor.college | 신소재공학과 | - |
dc.author.google | Kang, TD | - |
dc.author.google | Lee, H | - |
dc.author.google | Park, WI | - |
dc.author.google | Yi, GC | - |
dc.relation.volume | 44 | - |
dc.relation.issue | 1 | - |
dc.relation.startpage | 129 | - |
dc.relation.lastpage | 132 | - |
dc.relation.journal | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.relation.index | SCI급, SCOPUS 등재논문 | - |
dc.relation.sci | SCI | - |
dc.collections.name | Conference Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.44, no.1, pp.129 - 132 | - |
dc.identifier.wosid | 000188198100029 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.endPage | 132 | - |
dc.citation.number | 1 | - |
dc.citation.startPage | 129 | - |
dc.citation.title | JOURNAL OF THE KOREAN PHYSICAL SOCIETY | - |
dc.citation.volume | 44 | - |
dc.contributor.affiliatedAuthor | Yi, GC | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 10 | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.subject.keywordPlus | PHOTOREFLECTANCE SPECTRA | - |
dc.subject.keywordPlus | OPTICAL-CONSTANTS | - |
dc.subject.keywordPlus | LAYER | - |
dc.subject.keywordAuthor | ZnO | - |
dc.subject.keywordAuthor | dielectric function | - |
dc.subject.keywordAuthor | ellipsometry | - |
dc.subject.keywordAuthor | critical point | - |
dc.subject.keywordAuthor | Holden model | - |
dc.relation.journalWebOfScienceCategory | Physics, Multidisciplinary | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.relation.journalResearchArea | Physics | - |
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