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Cited 24 time in webofscience Cited 31 time in scopus
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dc.contributor.authorKim, JY-
dc.contributor.authorKwak, KS-
dc.contributor.authorKim, JS-
dc.contributor.authorKang, B-
dc.contributor.authorKwon, O-
dc.date.accessioned2016-03-31T13:15:52Z-
dc.date.available2016-03-31T13:15:52Z-
dc.date.created2009-02-28-
dc.date.issued2001-07-
dc.identifier.issn1071-1023-
dc.identifier.other2001-OAK-0000002142-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/19436-
dc.description.abstractThis article presents an etching process to fabricate a high-quality vertical facet for the photonic quantum ring (PQR) laser. The presented process uses the chemically assisted ion beam etching (CAIBE) method with a gas mixture of Ar:Cl-2:BCl3=5:2:3 sccm, and uses a single-layer photoresist etch mask to reduce the process complexity of etching GaAs/AlGaAs structures for the PQR laser. The angle theta between the incident beam and the normal direction of the substrate has been adjusted to achieve a high-quality vertical facet. Distortions on the mask pattern are not transferred to the etched side wall for theta greater than or equal to 25 degrees, and a vertical facet is obtained at theta similar to 25 degrees. The fabricated PQR lasers with the CAIBE process in this article show a sharp linewidth of similar to 0.06 nm. (C) 2001 American Vacuum Society.-
dc.description.statementofresponsibilityX-
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.relation.isPartOfJOURNAL OF VACUUM SCIENCE & TECHNOLOGY B-AN INTERNATIONAL JOURNAL DEVOTED TO MICROELECTRONICS AND NANOMETER STRUCTURES-PROCESSING MEASUREMENT AND PHENOMENA-
dc.subjectMICRODISK LASERS-
dc.titleFabrication of photonic quantum ring laser using chemically assisted ion beam etching-
dc.typeArticle-
dc.contributor.college전자전기공학과-
dc.identifier.doi10.1116/1.1382872-
dc.author.googleKim, JY-
dc.author.googleKwak, KS-
dc.author.googleKim, JS-
dc.author.googleKang, B-
dc.author.googleKwon, O-
dc.relation.volume19-
dc.relation.issue4-
dc.relation.startpage1334-
dc.relation.lastpage1338-
dc.contributor.id10071834-
dc.relation.journalJOURNAL OF VACUUM SCIENCE & TECHNOLOGY B-AN INTERNATIONAL JOURNAL DEVOTED TO MICROELECTRONICS AND NANOMETER STRUCTURES-PROCESSING MEASUREMENT AND PHENOMENA-
dc.relation.indexSCI급, SCOPUS 등재논문-
dc.relation.sciSCI-
dc.collections.nameJournal Papers-
dc.type.rimsART-
dc.identifier.bibliographicCitationJOURNAL OF VACUUM SCIENCE & TECHNOLOGY B-AN INTERNATIONAL JOURNAL DEVOTED TO MICROELECTRONICS AND NANOMETER STRUCTURES-PROCESSING MEASUREMENT AND PHENOMENA, v.19, no.4, pp.1334 - 1338-
dc.identifier.wosid000170598400033-
dc.date.tcdate2019-01-01-
dc.citation.endPage1338-
dc.citation.number4-
dc.citation.startPage1334-
dc.citation.titleJOURNAL OF VACUUM SCIENCE & TECHNOLOGY B-AN INTERNATIONAL JOURNAL DEVOTED TO MICROELECTRONICS AND NANOMETER STRUCTURES-PROCESSING MEASUREMENT AND PHENOMENA-
dc.citation.volume19-
dc.contributor.affiliatedAuthorKang, B-
dc.contributor.affiliatedAuthorKwon, O-
dc.identifier.scopusid2-s2.0-0035535268-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.wostc23-
dc.type.docTypeArticle-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaPhysics-

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