DC Field | Value | Language |
---|---|---|
dc.contributor.author | Hwu, Y | - |
dc.contributor.author | Tsai, WL | - |
dc.contributor.author | Lai, B | - |
dc.contributor.author | Je, JH | - |
dc.contributor.author | Fecher, GH | - |
dc.contributor.author | Bertolo, M | - |
dc.contributor.author | Margaritondo, G | - |
dc.date.accessioned | 2016-03-31T13:17:56Z | - |
dc.date.available | 2016-03-31T13:17:56Z | - |
dc.date.created | 2009-02-28 | - |
dc.date.issued | 2001-06-01 | - |
dc.identifier.issn | 0039-6028 | - |
dc.identifier.other | 2001-OAK-0000002039 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/19513 | - |
dc.description.abstract | We present several successful test cases of using photoelectron emission microscopy (PEEM) for photon energy up to 25 keV. First, the full extended X-ray absorption fine structure analysis was implemented in areas as small as 100 mum(2) for transition-metal K edge absorption spectra and, therefore, demonstrated the feasibility of combining structural and chemical analysis with hard-X-ray absorption spectroscopy with high lateral resolution. We also show that PEEM can be used in a transmission (radiography) mode as an imaging detector for hard-X-ray, This approach again leads to the unprecedented 0.3 mum lateral resolution, particularly critical for the use of coherence-based phase contrast techniques in real time X-ray radiology. (C) 2001 Elsevier Science B.V. All rights reserved. | - |
dc.description.statementofresponsibility | X | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.relation.isPartOf | SURFACE SCIENCE | - |
dc.subject | photoelectron emission | - |
dc.subject | X-ray absorption spectroscopy | - |
dc.subject | SYNCHROTRON-RADIATION | - |
dc.subject | THIN-FILMS | - |
dc.subject | SPECTROMICROSCOPY | - |
dc.subject | CONTRAST | - |
dc.subject | RESOLUTION | - |
dc.subject | MEPHISTO | - |
dc.subject | SURFACES | - |
dc.subject | IMAGES | - |
dc.title | Using photoelectron emission microscopy with hard-X-rays | - |
dc.type | Article | - |
dc.contributor.college | 신소재공학과 | - |
dc.identifier.doi | 10.1016/S0039-6028(01)00834-2 | - |
dc.author.google | Hwu, Y | - |
dc.author.google | Tsai, WL | - |
dc.author.google | Lai, B | - |
dc.author.google | Je, JH | - |
dc.author.google | Fecher, GH | - |
dc.author.google | Bertolo, M | - |
dc.author.google | Margaritondo, G | - |
dc.relation.volume | 480 | - |
dc.relation.issue | 3 | - |
dc.relation.startpage | 188 | - |
dc.relation.lastpage | 195 | - |
dc.contributor.id | 10123980 | - |
dc.relation.journal | SURFACE SCIENCE | - |
dc.relation.index | SCI급, SCOPUS 등재논문 | - |
dc.relation.sci | SCI | - |
dc.collections.name | Conference Papers | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | SURFACE SCIENCE, v.480, no.3, pp.188 - 195 | - |
dc.identifier.wosid | 000169285800013 | - |
dc.date.tcdate | 2019-01-01 | - |
dc.citation.endPage | 195 | - |
dc.citation.number | 3 | - |
dc.citation.startPage | 188 | - |
dc.citation.title | SURFACE SCIENCE | - |
dc.citation.volume | 480 | - |
dc.contributor.affiliatedAuthor | Je, JH | - |
dc.identifier.scopusid | 2-s2.0-0035365994 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
dc.description.wostc | 14 | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.subject.keywordPlus | SYNCHROTRON-RADIATION | - |
dc.subject.keywordPlus | THIN-FILMS | - |
dc.subject.keywordPlus | SPECTROMICROSCOPY | - |
dc.subject.keywordPlus | CONTRAST | - |
dc.subject.keywordPlus | RESOLUTION | - |
dc.subject.keywordPlus | MEPHISTO | - |
dc.subject.keywordPlus | SURFACES | - |
dc.subject.keywordPlus | IMAGES | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Physical | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Physics | - |
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