Using photoelectron emission microscopy with hard-X-rays
SCIE
SCOPUS
- Title
- Using photoelectron emission microscopy with hard-X-rays
- Authors
- Hwu, Y; Tsai, WL; Lai, B; Je, JH; Fecher, GH; Bertolo, M; Margaritondo, G
- Date Issued
- 2001-06-01
- Publisher
- ELSEVIER SCIENCE BV
- Abstract
- We present several successful test cases of using photoelectron emission microscopy (PEEM) for photon energy up to 25 keV. First, the full extended X-ray absorption fine structure analysis was implemented in areas as small as 100 mum(2) for transition-metal K edge absorption spectra and, therefore, demonstrated the feasibility of combining structural and chemical analysis with hard-X-ray absorption spectroscopy with high lateral resolution. We also show that PEEM can be used in a transmission (radiography) mode as an imaging detector for hard-X-ray, This approach again leads to the unprecedented 0.3 mum lateral resolution, particularly critical for the use of coherence-based phase contrast techniques in real time X-ray radiology. (C) 2001 Elsevier Science B.V. All rights reserved.
- Keywords
- photoelectron emission; X-ray absorption spectroscopy; SYNCHROTRON-RADIATION; THIN-FILMS; SPECTROMICROSCOPY; CONTRAST; RESOLUTION; MEPHISTO; SURFACES; IMAGES
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/19513
- DOI
- 10.1016/S0039-6028(01)00834-2
- ISSN
- 0039-6028
- Article Type
- Article
- Citation
- SURFACE SCIENCE, vol. 480, no. 3, page. 188 - 195, 2001-06-01
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- There are no files associated with this item.
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