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3D ATOM PROBE AND SIMS AS COMPLEMENTARY TECHNIQUES FOR THE OBSERVATION AND QUANTITATIVE MEASUREMENT OF MICROSTRUCTURES SCOPUS
- Title
- 3D ATOM PROBE AND SIMS AS COMPLEMENTARY TECHNIQUES FOR THE OBSERVATION AND QUANTITATIVE MEASUREMENT OF MICROSTRUCTURES
- Date Issued
- 2008-01
- Publisher
- .
- ISSN
- 1431-9276
- Article Type
- Article
- Citation
- MICROSCOPY AND MICROANALYSIS, vol. 14, page. 1232 - 1233, 2008-01
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Related Researcher
- 박찬경PARK, CHAN GYUNG
- Dept of Materials Science & Enginrg