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Electrical and reliability characteristics of a scaled (∼30nm) tunnel barrier selector (W/Ta2O5/TaOx/TiO2/TiN) with excellent performance (JMAX > 107A/cm2) SCOPUS
- Title
- Electrical and reliability characteristics of a scaled (∼30nm) tunnel barrier selector (W/Ta2O5/TaOx/TiO2/TiN) with excellent performance (JMAX > 107A/cm2)
- Authors
- Woo J.; Song J.; Moon K.; Lee J.H.; Cha E.; Prakash A.; Lee D.; Lee S.; Park J.; Koo Y.; Park C.G.; Hwang H.
- Date Issued
- 2014-09
- Publisher
- IEEE
- ISSN
- 0743-1562
- Article Type
- Article
- Citation
- Digest of Technical Papers - Symposium on VLSI Technology, 2014-09
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Related Researcher
- 박찬경PARK, CHAN GYUNG
- Dept of Materials Science & Enginrg