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DESIGN-FOR-TEST USING PARTIAL PARALLEL SCAN
- Title
- DESIGN-FOR-TEST USING PARTIAL PARALLEL SCAN
- Authors
- S. Lee; K. G. Shin
- Date Issued
- 1990-01
- Publisher
- IEEE
- Article Type
- Article
- Citation
- IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, vol. 9, no. 2, page. 203 - 211, 1990-01
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Related Researcher
- 이승구LEE, SUNG GU
- Dept of Electrical Enginrg