Note: Contrast enhancement and artifact suppression in computed tomography using sinogram normalization

Abstract

The intensity and direction of the incident beam at the sample position in synchrotron full-field transmission X-ray microscopy is subject to change. Incident-beam fluctuation in computed tomography results in significant contrast degradation of the reconstructed image. In the present study, we devised a simple method by which that problem could be corrected using sinogram normalization. According to our results, the image contrast was improved by 13%, and the artifacts were suppressed. © 2018 Author(s).