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Browsing "Department of Electrical Engineering (전자전기공학과)" by  SubjectAC stress

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Showing results 1 to 2 of 2
Article
Channel width dependence of AC stress on bulk nMOSFETsSCIESCOPUS

Microelectronics Reliability, vol. 64, page. 194 - 198, 2016-09

Article
Pulse duration effect during pulsed gate-bias stress in a-InGaZnO thin film transistorsSCIESCOPUS

SOLID-STATE ELECTRONICS, vol. 152, page. 53 - 57, 2019-02

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