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Browsing "1. Journal Papers" by AuthorPark, CK

전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

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Article

Edge Profile Effect of Tunnel Oxide on Erase Threshold Voltage Distributions in Flash Memory CellsSCIESCOPUS

IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. 53, no. 12, page. 3012 - 3019, 2006-12

Article

Reliable Extraction of Cycling Induced Interface States Implementing Realistic P/E Stresses in Reference Cell: Comparison with Flash Memory CellSCIESCOPUS

IEEE ELECTRON DEVICE LETTERS, vol. 27, no. 3, page. 169 - 171, 2006-03

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