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Department of Creative IT Engineering (창의IT융합공학과)
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Article
Reliable Extraction of Cycling Induced Interface States Implementing Realistic P/E Stresses in Reference Cell: Comparison with Flash Memory Cell
SCIE
SCOPUS
IEEE ELECTRON DEVICE LETTERS, vol. 27, no. 3, page. 169 - 171, 2006-03
Baek, CK
;
Kim, B
;
Son, Y
;
Kwon, W
;
Park, CK
;
Park, YJ
;
Min, HS
;
Kim, DM
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charge pumping
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flash EEPROM cell
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interface states
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