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Browsing "2. Conference Papers" by  AuthorAditya Bansal

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Showing results 2 to 4 of 4
Conference
PBTI/NBTI Monitoring Ring Oscillator Circuits with On-Chip Vt Characterization and High Frequency AC Stress Capability

Symposium on VLSI Circuits, page. 224 - 225, 2011-06-17

Conference
Reliability Monitoring Ring Oscillator Structures for Isolated/Combined NBTI and PBTI Measurement in High-K Metal Gate Technologies

IEEE International Reliability Physics Symposium (IRPS), page. 4.1 - 4.4, 2011-04-10

Conference
Usage-Based Degradation of SRAM Array due to Bias Temperature Instability

IEEE International Reliability Physics Symposium (IRPS), page. 6.1 - 6.4, 2012-04-18

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