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Department of Creative IT Engineering (창의IT융합공학과)
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Item hits:
Conference
Usage-Based Degradation of SRAM Array due to Bias Temperature Instability
IEEE International Reliability Physics Symposium (IRPS), page. 6.1 - 6.4, 2012-04-18
김재준
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Aditya Bansal
;
Rahul Rao
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