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Conference
A robust reliability methodology for accurately predicting Bias Temperature Instability Induced Circuit Performance Degradation in HKMG CMOS

IEEE International Reliability Physics Symposium (IRPS), page. 1.1 - 1.4, 2011-04-10

Conference
Reliability Monitoring Ring Oscillator Structures for Isolated/Combined NBTI and PBTI Measurement in High-K Metal Gate Technologies

IEEE International Reliability Physics Symposium (IRPS), page. 4.1 - 4.4, 2011-04-10

Conference
Bias Temperature Instability Model for Digital Circuits – Predicting Instantaneous FET Response

IEEE International Reliability Physics Symposium (IRPS), page. 2.1 - 2.4, 2011-04-10

Conference
Usage-Based Degradation of SRAM Array due to Bias Temperature Instability

IEEE International Reliability Physics Symposium (IRPS), page. 6.1 - 6.4, 2012-04-18

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