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Analysis of InGaN/GaN Multi Quantum Wells (MQWs) using by Aberration-Corrected Scanning Transmission Electron Microscopes and 3-D Atom Probe Tomography

Title
Analysis of InGaN/GaN Multi Quantum Wells (MQWs) using by Aberration-Corrected Scanning Transmission Electron Microscopes and 3-D Atom Probe Tomography
Authors
박찬경
Date Issued
2009-09-26
Publisher
FEMMS
URI
https://oasis.postech.ac.kr/handle/2014.oak/43917
Article Type
Conference
Citation
FEMMS, 2009-09-26
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박찬경PARK, CHAN GYUNG
Dept of Materials Science & Enginrg
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