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Analysis of InGaN/GaN Multi Quantum Wells (MQWs) using by Aberration-Corrected Scanning Transmission Electron Microscopes and 3-D Atom Probe Tomography
- Title
- Analysis of InGaN/GaN Multi Quantum Wells (MQWs) using by Aberration-Corrected Scanning Transmission Electron Microscopes and 3-D Atom Probe Tomography
- Authors
- 박찬경
- Date Issued
- 2009-09-26
- Publisher
- FEMMS
- Article Type
- Conference
- Citation
- FEMMS, 2009-09-26
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Related Researcher
- 박찬경PARK, CHAN GYUNG
- Dept of Materials Science & Enginrg