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PBTI Associated Hot Carrier Characteristics of Nano-scale NMOSFETs with Advanced Gate Stack of Metal Gate/High-k Dielectrics
- Title
- PBTI Associated Hot Carrier Characteristics of Nano-scale NMOSFETs with Advanced Gate Stack of Metal Gate/High-k Dielectrics
- Authors
- 정윤하
- Date Issued
- 2007-12-06
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- in 38th IEEE Semiconductor Interface Specialists Conference, page. 8, 2007-12-06
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Related Researcher
- 정윤하JEONG, YOON HA
- Dept of Electrical Enginrg