Full metadata record
DC Field | Value | Language |
dc.contributor.author | 정윤하 | - |
dc.date.accessioned | 2018-05-23T15:50:32Z | - |
dc.date.available | 2018-05-23T15:50:32Z | - |
dc.date.created | 2010-09-09 | - |
dc.date.issued | 2010-05-04 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/47124 | - |
dc.publisher | IEEE | - |
dc.relation.isPartOf | IEEE IRPS(International Reliability Physics Symposium) | - |
dc.relation.isPartOf | PROCEEDINGS OF INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM | - |
dc.title | Characterization of Gate-All-Around Si-NWFET, including Rsd, Cylindrical Coordinate Based 1/f Noise and Hot Carrier Effects | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | IEEE IRPS(International Reliability Physics Symposium), pp.94 - 98 | - |
dc.citation.conferenceDate | 2010-05-02 | - |
dc.citation.conferencePlace | US | - |
dc.citation.endPage | 98 | - |
dc.citation.startPage | 94 | - |
dc.citation.title | IEEE IRPS(International Reliability Physics Symposium) | - |
dc.contributor.affiliatedAuthor | 정윤하 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.