Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 백창기 | - |
| dc.date.accessioned | 2018-05-24T10:56:17Z | - |
| dc.date.available | 2018-05-24T10:56:17Z | - |
| dc.date.created | 2017-02-18 | - |
| dc.date.issued | 2016-06-22 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/49241 | - |
| dc.publisher | 대한전자공학회 | - |
| dc.relation.isPartOf | 2016 대한전자공학회 하계학술대회 | - |
| dc.relation.isPartOf | 2016 대한전자공학회 하계학술대회 논문집 | - |
| dc.title | 도핑농도에 따른 나노선 ISFET 센서의 잡음 특성 | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | 2016 대한전자공학회 하계학술대회 | - |
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | 2016 대한전자공학회 하계학술대회 | - |
| dc.contributor.affiliatedAuthor | 백창기 | - |
| dc.description.journalClass | 2 | - |
| dc.description.journalClass | 2 | - |
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Related Researcher
- 백창기BAEK, CHANG KI
- Dept. Convergence IT Engineering