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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 백록현 | - |
| dc.contributor.author | 강창용 | - |
| dc.contributor.author | 손창우 | - |
| dc.contributor.author | C.Hobbs | - |
| dc.contributor.author | P.Kirsch | - |
| dc.contributor.author | R.Jammy | - |
| dc.date.accessioned | 2018-05-24T11:24:19Z | - |
| dc.date.available | 2018-05-24T11:24:19Z | - |
| dc.date.created | 2017-02-23 | - |
| dc.date.issued | 2013-06-10 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/49472 | - |
| dc.publisher | IEEE | - |
| dc.relation.isPartOf | International Symposium on VLSI Technology (VLSI2013) | - |
| dc.relation.isPartOf | INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY DIGEST | - |
| dc.title | Effects of Layout and Process Parameters on Device/Circuit Performance and Variability for 10nm Node FinFET Technology | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | International Symposium on VLSI Technology (VLSI2013) | - |
| dc.citation.conferencePlace | US | - |
| dc.citation.title | International Symposium on VLSI Technology (VLSI2013) | - |
| dc.contributor.affiliatedAuthor | 백록현 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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- 백록현BAEK, ROCK HYUN
- Dept of Electrical Enginrg