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Reliable Extraction of Series Resistance in Silicon Nanowire FETs Using Y-function Technique
- Title
- Reliable Extraction of Series Resistance in Silicon Nanowire FETs Using Y-function Technique
- Date Issued
- 2011-10-19
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- IEEE Nanotechnology Materials and Devices Conference (NMDC2011), 2011-10-19
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Related Researcher
- 백록현BAEK, ROCK HYUN
- Dept of Electrical Enginrg