Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Analysis of Parasitic Bottom Capacitance in n- and p-type Si-Nanowire Field Effect Transistors on Bulk
- Title
- Analysis of Parasitic Bottom Capacitance in n- and p-type Si-Nanowire Field Effect Transistors on Bulk
- Date Issued
- 2011-08-15
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- IEEE-NANO (2011), 2011-08-15
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 백록현BAEK, ROCK HYUN
- Dept of Electrical Enginrg