The Performance of HfSiON/TiN Gate Stack MOSFETs for 45 nm Node LSTP Application Using Conventional Fabrication Process
- Title
- The Performance of HfSiON/TiN Gate Stack MOSFETs for 45 nm Node LSTP Application Using Conventional Fabrication Process
- Authors
- 백록현; 박민상; 이경택; 최길복; 홍승호; 최현식; 송승현; 김재철; 사공현철; 정성우; 이희덕; 정윤하
- Date Issued
- 2008-10-20
- Publisher
- IEEE
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/49494
- Article Type
- Conference
- Citation
- IEEE Nanotechnology Materials and Devices Conference (NMDC2008), 2008-10-20
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- There are no files associated with this item.
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