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Accurate Extraction of Volume Trap Density from Si-Nanowire FET using the Newly Developed Cylindrical Coordinate Based 1/f noise model
- Title
- Accurate Extraction of Volume Trap Density from Si-Nanowire FET using the Newly Developed Cylindrical Coordinate Based 1/f noise model
- Date Issued
- 2010-02-24
- Publisher
- 대한전자공학회
- Article Type
- Conference
- Citation
- 17th Korean Conference on Semiconductors (2010), 2010-02-24
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Related Researcher
- 백록현BAEK, ROCK HYUN
- Dept of Electrical Enginrg