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Hot Electron Degradation Effects in 35nm InAlAs/InGaAs Metamorphic HEMT
- Title
- Hot Electron Degradation Effects in 35nm InAlAs/InGaAs Metamorphic HEMT
- Date Issued
- 2009-11-28
- Publisher
- 대한전자공학회
- Article Type
- Conference
- Citation
- 대한전자공학회 추계학술대회 2009, 2009-11-28
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Related Researcher
- 백록현BAEK, ROCK HYUN
- Dept of Electrical Enginrg