DC Field | Value | Language |
---|---|---|
dc.contributor.author | 백록현 | - |
dc.contributor.author | 이경택 | - |
dc.contributor.author | 강창용 | - |
dc.contributor.author | 최현식 | - |
dc.contributor.author | 홍승호 | - |
dc.contributor.author | 최길복 | - |
dc.contributor.author | 김재철 | - |
dc.contributor.author | 송승현 | - |
dc.contributor.author | 박민상 | - |
dc.contributor.author | 사공현철 | - |
dc.contributor.author | 사공성환 | - |
dc.contributor.author | 이병훈 | - |
dc.contributor.author | G. Bersuker | - |
dc.contributor.author | H. H. Tseng | - |
dc.contributor.author | R. Jammy | - |
dc.contributor.author | 정윤하 | - |
dc.date.accessioned | 2018-05-24T11:44:21Z | - |
dc.date.available | 2018-05-24T11:44:21Z | - |
dc.date.created | 2017-03-01 | - |
dc.date.issued | 2008-09-29 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/49835 | - |
dc.publisher | IEEE Device Society | - |
dc.relation.isPartOf | ISAGST 2008 | - |
dc.relation.isPartOf | INTERNATIONAL SYMPOSIUM ON ADVANCED GATE STACK TECHNOLOGY | - |
dc.title | PBTI and HCI stress-induces trap generation in SiO2/HfO2 gate stack NMOSFETs and its impact on low frequency noise | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | ISAGST 2008 | - |
dc.citation.conferencePlace | US | - |
dc.citation.title | ISAGST 2008 | - |
dc.contributor.affiliatedAuthor | 백록현 | - |
dc.description.journalClass | 1 | - |
dc.description.journalClass | 1 | - |
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