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Time-truncated attribute sampling plans using EWMA for Weibull and Burr type X distributions SCIE SCOPUS

Title
Time-truncated attribute sampling plans using EWMA for Weibull and Burr type X distributions
Authors
Aslam, MuhammadBalamurali, S.Jun, Chi-HyuckMeer, Aneela
Date Issued
2017-06
Publisher
TAYLOR & FRANCIS INC
Abstract
Acceptance sampling, widely used in various production industries, is a very vital tool of quality control. In this paper, a new attribute acceptance-sampling plan is developed based on the exponentially weighted moving average statistic under a time-truncated life test when the product lifetime follows the Weibull distribution or the Burr type X distribution. The performance measures such as the probability of acceptance and the average sample number are derived. Tables are constructed for the selection of optimal parameters of the proposed sampling plan so as to minimize the average sample number satisfying the producer's and the consumer's risks. Illustrative example is also given for the application of the proposed plan. It is also shown that the proposed plan requires a smaller sample size compared to the single sampling plan.
Keywords
LIFE-TEST; VARIABLES INSPECTION
URI
https://oasis.postech.ac.kr/handle/2014.oak/50718
DOI
10.1080/03610918.2015.1105977
ISSN
0361-0918
Article Type
Article
Citation
COMMUNICATIONS IN STATISTICS-SIMULATION AND COMPUTATION, vol. 46, no. 6, page. 4173 - 4184, 2017-06
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전치혁JUN, CHI HYUCK
Dept of Industrial & Management Enginrg
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