Polarization-Dependent Photoinduced Bias-Stress Effect in Single-Crystal Organic Field-Effect Transistors
SCIE
SCOPUS
- Title
- Polarization-Dependent Photoinduced Bias-Stress Effect in Single-Crystal Organic Field-Effect Transistors
- Authors
- Choi, Hyun Ho; Najafov, Hikmet; Kharlamov, Nikolai; Kaznetsov, Denis V.; Didenko, Sergei I.; Cho, Kilwon; Briseno, Alejandro L.; Podzorov, Vitaly
- Date Issued
- 2017-10
- Publisher
- AMER CHEMICAL SOC
- Abstract
- Photoinduced charge transfer between semiconductors and gate dielectrics can occur in organic field-effect transistors (OFETs) operating under illumination, leading to a pronounced bias-stress effect in devices that are normally stable while operating in the dark. Here, we report an observation of a'polarization-dependent photoinduced bias-stress effect in two" prototypical single-crystal OFETs, based on rubrene and tetraphenylbis(indolo{l,2-alpha})quinolin. We find that the decay rate of the source-drain current in these OFETs under, illumination is a periodic function of the polarization angle of incident photoexcitation with respect to the crystal axes, with a periodicity of n. The angular positions of maxima and minima of the bias-stress rate match those of the optical absorption coefficient of the corresponding crystals. The analysis of the effect shows that it stems from a charge transfer of "hot" holes, photogenerated in the crystal within a very short thermafization length (MLT mu m) from the semiconductor-dielectric interface. The observed phenomenon is a type of intrinsic structure-property relationship, revealing how molecular packing affects parameter drift in organic transistors under illumination. We also demonstrate that a photoinduced charge transfer in OFETs can be used for recording rewritable accumulation channels with an optically defined geometry and resolution, which can be used in a number of potential applications.
- Keywords
- THIN-FILM TRANSISTORS; THRESHOLD VOLTAGE SHIFTS; SEMICONDUCTORS; INTERFACES; MEMORY
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/50829
- DOI
- 10.1021/acsami.7b11134
- ISSN
- 1944-8244
- Article Type
- Article
- Citation
- ACS APPLIED MATERIALS & INTERFACES, vol. 9, no. 39, page. 34153 - 34161, 2017-10
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