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Negative Photoconductance in Heavily Doped Si Nanowire Field-Effect Transistors SCIE SCOPUS

Title
Negative Photoconductance in Heavily Doped Si Nanowire Field-Effect Transistors
Authors
Baek, E.Rim, T.Sch?tt, J.Baek, C.-K.Kim, K.Baraban, L.Cuniberti, G.
Date Issued
2017-11
Publisher
American Chemical Society
Abstract
We report the first observation of negative photoconductance (NPC) in n- and p-doped Si nanowire field-effect transistors (FETs) and demonstrate the strong influence of doping concentrations on the nonconventional optical switching of the devices. Furthermore, we show that the NPC of Si nanowire FETs is dependent on the wavelength of visible light due to the phonon-assisted excitation to multiple conduction bands with different band gap energies that would be a distinct optoelectronic property of indirect band gap semiconductor. We attribute the main driving force of NPC in Si nanowire FETs to the photogenerated hot electrons trapping by dopants ions and interfacial states. Finally, comparing back- and top-gate modulation, we derive the mechanisms of the transition between negative and positive photoconductance regimes in nanowire devices. The transition is decided by the competition between the light-induced interfacial trapping and the recombination of mobile carriers, which is dependent on the light intensity and the doping concentration. ? 2017 American Chemical Society.
Keywords
Doping (additives); Energy gap; High intensity light; Hot electrons; III-V semiconductors; Light; Nanowires; Semiconducting silicon; Semiconductor doping; Silicon; Transistors; Electron trapping; Indirect band gap; interfacial trapping; Photoconductance; Si nanowire; Field effect transistors
URI
https://oasis.postech.ac.kr/handle/2014.oak/51000
DOI
10.1021/acs.nanolett.7b02788
ISSN
1530-6984
Article Type
Article
Citation
Nano Letters, vol. 17, no. 11, page. 6727 - 6734, 2017-11
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