Novel Extrinsic Series Resistance Extraction Methodology for Nanoscale MOSFETs
- Title
- Novel Extrinsic Series Resistance Extraction Methodology for Nanoscale MOSFETs
- Authors
- 정윤하
- Date Issued
- 2008-12-03
- Publisher
- IEEE
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/51786
- Article Type
- Conference
- Citation
- IEEE International RF and Microwave Conference (RFM 2008), page. 294 - 298, 2008-12-03
- Files in This Item:
- There are no files associated with this item.
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