Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 정윤하 | - |
| dc.date.accessioned | 2018-06-15T06:58:32Z | - |
| dc.date.available | 2018-06-15T06:58:32Z | - |
| dc.date.created | 2009-08-06 | - |
| dc.date.issued | 2008-12-03 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/51786 | - |
| dc.publisher | IEEE | - |
| dc.relation.isPartOf | IEEE International RF and Microwave Conference (RFM 2008) | - |
| dc.relation.isPartOf | IEEE International RF and Microwave Conference (RFM 2008) | - |
| dc.title | Novel Extrinsic Series Resistance Extraction Methodology for Nanoscale MOSFETs | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | IEEE International RF and Microwave Conference (RFM 2008), pp.294 - 298 | - |
| dc.citation.conferenceDate | 2008-12-02 | - |
| dc.citation.endPage | 298 | - |
| dc.citation.startPage | 294 | - |
| dc.citation.title | IEEE International RF and Microwave Conference (RFM 2008) | - |
| dc.contributor.affiliatedAuthor | 정윤하 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 정윤하JEONG, YOON HA
- Dept of Electrical Enginrg