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Novel Extrinsic Series Resistance Extraction Methodology for Nanoscale MOSFETs
- Title
- Novel Extrinsic Series Resistance Extraction Methodology for Nanoscale MOSFETs
- Authors
- 정윤하
- Date Issued
- 2008-12-03
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- IEEE International RF and Microwave Conference (RFM 2008), page. 294 - 298, 2008-12-03
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Related Researcher
- 정윤하JEONG, YOON HA
- Dept of Electrical Enginrg