Model Independent Analysis Method of Ultra-thin Film Thickness in X-ray Reflectivity Measurement
- Title
- Model Independent Analysis Method of Ultra-thin Film Thickness in X-ray Reflectivity Measurement
- Authors
- 이기봉; 황상윤; 조병관; 박용준
- Date Issued
- 2011-04-13
- Publisher
- 한국물리학회
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/58578
- Article Type
- Conference
- Citation
- 한국물리학회 2011년 봄학술논문발표회, page. 99 - 99, 2011-04-13
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- There are no files associated with this item.
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