Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Model Independent Analysis Method of Ultra-thin Film Thickness in X-ray Reflectivity Measurement
- Title
- Model Independent Analysis Method of Ultra-thin Film Thickness in X-ray Reflectivity Measurement
- Date Issued
- 2011-04-13
- Publisher
- 한국물리학회
- Article Type
- Conference
- Citation
- 한국물리학회 2011년 봄학술논문발표회, page. 99 - 99, 2011-04-13
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 이기봉LEE, KI BONG
- Div. of Advanced Nuclear Enginrg