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Conference
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dc.contributor.author오상호-
dc.contributor.author신가영-
dc.contributor.author이호녕-
dc.contributor.author임지성-
dc.contributor.author송경-
dc.date.accessioned2018-06-18T04:10:58Z-
dc.date.available2018-06-18T04:10:58Z-
dc.date.created2012-03-29-
dc.date.issued2011-09-21-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/61138-
dc.publisherFEMMS-
dc.relation.isPartOfFrontiers of Electron Microscopy in Materials Science-
dc.titleIn-situ TEM Biasing Experiments to Study Thickness-dependent Ferroelectric Domain Switching of Pb(Zr,Ti)O3 Films-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationFrontiers of Electron Microscopy in Materials Science-
dc.citation.conferenceDate2011-09-18-
dc.citation.conferencePlaceUS-
dc.citation.titleFrontiers of Electron Microscopy in Materials Science-
dc.contributor.affiliatedAuthor오상호-
dc.contributor.affiliatedAuthor신가영-
dc.contributor.affiliatedAuthor임지성-
dc.contributor.affiliatedAuthor송경-
dc.description.journalClass1-
dc.description.journalClass1-

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오상호OH, SANG HO
Dept of Materials Science & Enginrg
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