In-situ TEM Biasing Experiments to Study Thickness-dependent Ferroelectric Domain Switching of Pb(Zr,Ti)O3 Films
- Title
- In-situ TEM Biasing Experiments to Study Thickness-dependent Ferroelectric Domain Switching of Pb(Zr,Ti)O3 Films
- Authors
- 오상호; 신가영; 이호녕; 임지성; 송경
- Date Issued
- 2011-09-21
- Publisher
- FEMMS
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/61138
- Article Type
- Conference
- Citation
- Frontiers of Electron Microscopy in Materials Science, 2011-09-21
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- There are no files associated with this item.
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